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Variability and endurance dilemma in the TiO x /Al 2 O 3 RRAM. (a

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Point Contact Resistive Switching Memory Based On, 44% OFF

Nanomaterials, Free Full-Text

a) The endurance and (b) the retention characteristics of the

Nanomaterials, Free Full-Text

Variability and endurance dilemma in the TiO x /Al 2 O 3 RRAM. (a

The schematic of 3D horizontal stacking RRAM array (HRRAM). The

Metals, Free Full-Text

Excellent resistive switching properties of atomic layer-deposited

Examples of plots that do not provide enough data to reliably

Device area effect of Al/HfOx/Al RRAM (a) on the HRS and LRS, (b

Improving endurance and reliability by optimizing the alternating

Facilitation of the thermochemical mechanism in NiO-based

Point Contact Resistive Switching Memory Based On, 44% OFF

Voltage divider effect for the improvement of variability and